| Center |
| Student Information Service-Master |
| Departament |
| Applied Physics and Electromagnetism |
| Lecturers in charge |
| Sin datos cargados |
| Met. Docent |
| Laboratory sessions in which explanations, data acquisition and preliminary analysis are carried out. One experiment per session plus three data analysis and problem solving sessions. |
| Met. Avaluació |
| Continuos evaluation - The evaluation will be based on two concepts: - Obligatory: Periodical control of results of each practice (80%). AND Optional: oral exhibition of foundations, results and conclusions of one of the practices (20%). |
| Bibliografia |
| - "Introduction to solid state physics", C. Kittel, Ed. John Wiley, 1976. - "Solid state physics", H. Ibach, H. Lüth, Ed. Springer-Verlag, - "Physics of semiconductor devices", S.N. Sze, Ed. John Wiley, New - "Fundamentos de electrónica física y microelectrónica", J.M. |
| Continguts |
| 1) Bravais networks and crystalline structures. 2) X-Ray diffraction simulation 3) Simulation of net vibrations by means of a mechanical system of coupled oscillators: acoustic and optic branch. 4) Measurement of transport properties in semiconductors under temperature. 5) Measurement of a semiconductor absorption coefficient. Bandgap as a function of temperature 6) Measurement of specific heat in solids. Debye temperature . 7) Ferroelectric materials. Determination of the Curie Temperature 8) Caracterization of semiconductor devices. Measurement of the I(V) characteristic under temperature. 9) Photodiode and solar cell characterization. Measurement of photovoltaic response. |
| Objetius |
| Introduction to measurement techniques of basic properties of solids, with special incidence in semiconductors and in characterization techniques of electronic devices. |
| URL de Fitxa |
| http://www.uv.es/elecfis/fisol/Fisol.htm |